Swissbit’s 2.5” SSDs are ideal solutions for embedded applications requiring reliable and long service life storage. The X-60 SATA 6Gb/s series is Swissbit’s MLC based solution for high performance, cost sensitive, high capacity markets. X-600 has best-in-class endurance, using SLC technology while X-66 is the perfect compromise with MLC NAND in pSLC mode. ALL products feature Swissbit’s proven Power Fail Safety, Data Care Management, a detailed S.M.A.R.T.-based Life Time Monitoring, NCQ, TRIM, advanced wear leveling, bad block management and in-field firmware update functionality.

The X-60 supports AES security and can be used as a self- encrypted drive (SED).

Series Name

X-500

X-600

X-60 / X-66

X-70

X-75

Standard & Interface

SATA II – 3 Gbit/s

up to UDMA6 / PIO4 / MDMA2

SATA III – 6 Gbit/s

ATA8

Package

SATA 2.5" SSD

Connector

15 + 7 pin Serial ATA
with latch protection /
special feature connector

15 + 7 pin Serial ATA

Outline Dimensions

100.2 x 69.85 x 9.3 mm

100.2 x 69.85 x 7.0 mm

 

Flash Type

SLC

pSLC / MLC

3D NAND

Industrial grade 3D NAND

Density Range

16 GB – 512 GB

8 GB - 256

pSLC: X-66: 16 GB - 240 GB

MLC: X-60: 30 GB - 960 GB

240 GB – 1 TB

240 GB – 2 TB

Data Retention

10 years @ life begin

1 year @ life end

Endurance

5.8 TBW
per GB drive capacity

8.7 TBW
per GB drive capacity

3.8 / 0.6 TBW
per GB drive capacity

tbd / 1,000 P/E cycles
(Flash cell level)

tbd / 3,000 P/E cycles
(Flash cell level)

Operating Temperature

Commercial: 0°C to +70°C

Industrial: -40°C to +85°C

0°C to +70°C

0°C to +70°C
-40°C to +85°C

Storage Temperature

-55°C to + 95°C

-40°C to + 85°C

Performance

Sequential Read (MB/s)

Sequential Write (MB/s)

Random 4KB Read (IOPS)

Random 4KB Write (IOPS)

 

up to 240

up to 220

up to 14,500

up to 5,300

 

up to 520

up to 425

up to 79,000

up to 76,000

 

up to 520 / 525

up to 450 / 460

up to 74,000 / 74,500

up to 75,000 / 77,900

 

up to 560

up to 530

up to 81,000

up to 81,000

 

up to 560

up to 530

up to 81,000

up to 81,000

MTBF

≥ 2,000,000 hours

Shock

1,500G, 0.5 ms

Vibration

50 G, 131-2,000 Hz

Humidity

85 % RH 85°C, 1,000 hrs

Voltage

5 V ± 10 % / 3.3 V optional

5 V ± 10 %

Power Consumption

idle 200 mA

max 700 mA

idle 60 mA

max 1,200 mA

idle 100 mA

max 650 mA

dle 100 mA

max 650 mA

Features & Tools

Proven Power Fail Safety

ATA security feature set

Enhanced Secure Erase, Purge & Sanitize
features (MIL STD)

NCQ, TRIM

Advanced Wear Leveling & Bad Block
management

In-field firmware update

SBLTM Tool & SDK for S.M.A.R.T. based

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management

In-field firmware update

S.M.A.R.T. based Life Time Monitoring tool

Proven Power Fail Safety

NCQ, TRIM

Advanced Wear Leveling & Bad Block management
Data care manegement

In-field firmware update

detailled S.M.A.R.T. based Life Time Monitoring tool

AES 256  (SED) / TCG Opal

E2E Data Protection

 

Part Number

SFSAxxxxQvBJxss-t-dd-rrr-ccc

SFSAxxxxQvAAxss-t-dd-rrr-ccc

SFSAxxxxQvAHxss-t-dd-rrr-ccc

SFSAxxxxQvAHxss-t-dd-rrr-ccc

 

Product Features

Data Care Managment

Various effects like data retention, read disturb limits or temperature can impact data reliability. The latest generation of Swissbit products use special methods to maintain and refresh the data for higher data integrity.

ESD and EMI safe

The product designs are in line with the latest regulations for electrostatic discharge and electromagnetic interference. Swissbit strives to exceed these limits with our own in-house technology and production capabilities, for example with System-in-Package (SiP) competence.

Life time monitoring (LTM)

The Swissbit Life Time Monitoring feature enables users to access the memory device’s detailed Life Time Status and allows predicting imminent failure avoiding unexpected data loss. This feature uses an extended S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology) interface or vendor specific commands to retrieve the Flash product information.

Power fail protection

Intelligent Power Fail Protection & Recovery protects data from unexpected power loss. During an unintentional shutdown, firmware routines and an intelligent hardware architecture ensure that all system and user data will be stored to the NAND.

Read only optimized

In many industrial applications the data is written to the NAND Flash once and is only read afterwards. For such cases the firmware can be optimized in order to guarantee highest possible data retention and less read disturb.

Secure erase (Sanitize / Purge) / Fast erase

This feature uses an uninterruptable sequence of data erase commands. Even a power off can’t stop the process which will continue upon restoration of power. The optional enhanced feature allows the customer to sanitize the data according to different standards like DoD, NSA, IREC, etc. The purge algorithm can be started by a software command or through a hardware pin.

Shock and vibration

Robustness is one of our key specification targets. The design, assembly and use of selected materials guarantee an extremely solid design which has been validated by extensive testing.

Temperature sensor

The sensor allows the host hardware or software to monitor the memory device temperature to improve data reliability in the target application environment.

Trim support

The TRIM command allows the operating system to inform the SSD which blocks of data are no longer considered in use and can be wiped out internally which increases system performance in following write accesses. With TRIM Support data scrap can be deleted in advance which otherwise would slow down future write operations to the involved blocks.

WAF reduction

The WAF (write amplification factor) for MLC based products is reduced by combining a paged based FW block management with a powerful card architecture and configuration settings.

Wear leveling

Sophisticated Wear Leveling & Bad Block Management ensure that Flash cells are sparingly and equally used in order to prolong life time of the device.

Wide temperature support

Swissbit‘s embedded memory & storage solutions are designed and approved for reliable operation over a wide temperature range. The products are verified at temperature corners and prestressed with a burn-in operating functional test (Test During Burn In – TDBI).

Get our Newsletter